Test and Measurement

Averna Protocol Analyzer

Averna analyzer to test Intel DOCSIS 3.1 chipset

Averna announced that Intel has selected its DP-1000 DOCSIS Protocol Analyzer to test its DOCSIS 3.1 chipset prior to final certification. The company said DP-1000 captures and filters MAC-layer


Anritsu, Altair to demo LTE CAT-0 capability for IoT

Anritsu Company and Altair Semiconductor will demonstrate the world’s first LTE CAT-0 capability for Internet of Things (IoT) during CTIA Super Mobility 2015 in Las Vegas, September 9-11.