NI on Monday announced the launch of NI-RFmx 2.2, the latest version of its measurement software for PXI RF test systems.

When used with the second-generation PXI Vector Signal Transceiver (VST), engineers can test 4.5G and 5G RF components such as transceivers and amplifiers using a wide range of carrier aggregation schemes.

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With the second-generation VST, engineers can simultaneously generate and measure up to 32 LTE carriers, each with 20 MHz of bandwidth, and use the software to specify a variety of carrier spacing schemes.

National Instruments says that the new version of NI-RFmx features algorithm improvements for reduced measurement time. Engineers performing modulation quality and spectral measurements for wireless technologies such as UMTS/HSPA+ and LTE/LTE-Advanced Pro can experience EVM measurement time reductions of up to 33 percent by installing the latest version of the software.

“By adopting PXI and LabVIEW along with NI-RFmx measurement software, we have seen many customers in the semiconductor industry significantly cut test time for RF measurements, resulting in lower cost of test and faster time to market,” said Charles Schroeder, vice president of RF at NI.

NI-RFmx adds enhanced support for measurements such as intermodulation distortion, third order intercept, and both Y-factor and cold source noise figure measurements. These measurements integrate with the PXIe-5668R RF signal analyzer so engineers can easily configure high-performance PXI intermodulation distortion and noise figure test sets.