Anritsu Company, a global provider in LTE test solutions, announced that its ME7834A/L Mobile Device Test Platform has won the Best Network/Device Testing Products award for LTE category, at LTE North America Awards Dinner held in Dallas.
The ME7834A/L is a scalable system for protocol conformance and carrier acceptance testing of 2G, 3G, and 4G/LTE wireless technologies. Wireless device OEMs, carriers, test houses, and other elements of the device ecosystem are able to use this system to quickly and easily determine a device’s conformance to 3GPP and carrier-specific standards.
The LTE North America Awards recognize growth and success of companies. The ME7834A/L was selected an operator-led panel after extensive evaluation of countless entries in the Best
Network/Device Testing category.
The ME7834A/L is recognized by this award as an innovative product that is helping in the successful roll out and implementation of LTE technology worldwide.
“The LTE Awards recognize the best in LTE technology. Earning an LTE Award signifies that Anritsu is committed to providing innovative test solutions and establishing itself as a leader in LTE,” said Wade Hulon, vice president and general manager, Anritsu Americas.
“The award is especially significant because it was given after extensive review by a panel of industry experts who recognized that the ME7834A/L meets the needs of chipset and device manufacturers in a manner unlike any other test solution on the market,” Hulon added.
Integrated “best-in-class” signaling testers for LTE, UTRAN/GERAN, and CDMA2000 technologies enable the ME7834A/L to offer excellent platform flexibility, including simulation of inter-RAT handovers, complex cell selection environments, high-speed throughput, and mobility with fading.
Additionally, the choice of test case programming and execution environments, including the graphical Rapid Test Designer (RTD) software, and TTCN3-based Protocol Conformance Test (PCT)
software, allows the ME7834A/L to easily adapt to end-user requirements.
Recently, Frost & Sullivan presented Anritsu with a 2011 Global Customer Enhancement Award in Passive Intermodulation (PIM) Testing. The award was presented to Anritsu for its introduction of the innovative MW8219A PIM Master, and how the test solution addresses the growing need to locate and correct PIM in wireless networks.
Anritsu Corporation recently announced that it offered more protocol conformance test cases for LTE terminal equipment than any other test system vendor at Global Certification Forum (GCF) meeting.
By Telecomlead.com Team