By Telecom Lead Team: Agilent Technologies announced that
its electronic test equipment will be used by NXP Semiconductors in a
demonstration of its beam-forming technology for the next generation of
communication and radar products at CES 2012.
We are pleased to provide test hardware and software
capabilities to support the demonstration of NXP’s core technology. Our early
investments and continued commitment to this technology and the WiGig Alliance
are allowing the industry to design and develop products more rapidly in
the 60-GHz frequency band through our superior capabilities in
wide-bandwidth modulation, analysis and millimeter applications,” said Guy
Sene, president of Agilent‘s
Electronic Measurement Group.
NXP will demonstrate a multi-Gbps wireless link based on
the Wireless Gigabit Alliance and the IEEE 802.11ad specifications.
The NXP demonstration will include WiGig and IEEE
802.11ad physical-layer specifications equipment from Agilent. The test
equipment will provide signal creation and analysis capabilities to complement
NXP’s RFIC chipset.
NXP’s technology enables highly integrated, low-power,
beam-forming and beam-steering systems for increased WiGiG/802.11ad room
coverage.
Next-generation car-radar systems will also profit from
these core developments, enabling integration of CMOS phased-array
millimeter-wave circuits with IF, ADC and DSP blocks into a highly integrated,
low-power, car-radar signal processor.
Agilent Technologies recently added two new oscilloscopes to its portfolio of handheld
instruments. The 100-MHz U1610A and 200-MHz U1620A are the first handheld units
to include a color VGA display.
These instruments enable engineers to view signal
waveforms by zooming in to capture glitches under all lighting conditions by
offering up to three viewing modes (indoor, outdoor and night vision).
