Keysight Technologies has introduced M9451A PXIe Measurement Accelerator, a high performance FPGA processing card, which speeds envelope tracking (ET) and digital pre-distortion (DPD) characterization for power amplifier test.
The M9451A enables engineers to make closed/open loop DPD and envelope tracking measurements in tens of milliseconds for up to a 100 times speed improvement.
Company said the M9451A is integrated with the RF PA/FEM Characterization and Test, Reference Solution, to provide higher throughput while maintaining highly accurate S-parameter, harmonic distortion, power and demodulation measurements.
The solution is capable of providing consistent measurements, from simulation to manufacturing, for next-generation power amplifier modules.
Engineers can also improve device performance with DPD and ET while reducing test time as the Reference Solution’s open source test scripting example code facilitates rapid evaluation of power amplifier test configurations and reduces time to first measurement.
Company officials said customers can count on consistent measurement results, from R&D through production and realize accelerated design cycle time.
The Reference Solution enables full characterization of next-generation power amplifier modules, such as a power amplifier-duplexer (PAD).
PADs offer greater efficiency and value with low power consumption as well as allow device designers to save and optimize space by replacing multiple discrete components with a single compact module.
Additionally, the Keysight M9451A PXIe Measurement Accelerator with DPD/ET gateware is available at $20,000.
The price of the RF PA/FEM Characterization and Test, Reference Solution is based on a customer’s specific test system requirements.
Last month, Keysight Technologies introduced the Advanced Design System (ADS) PCI Express and USB Compliance Test Benches.
Few days ago, Keysight Technologies unveiled SystemVue 2015.01, a new version of its premier system-level electronic design automation software.