Mobile World Congress 2012: National Instruments launches test solution for 802.11ac WLAN

Telecom Lead Team:
 National Instruments announced early
access support for testing next-generation 802.11ac WLAN chipsets and devices.

802.11ac WLAN test solution provides flexibility in testing 802.11ac devices in
addition to testing 802.11a/b/g/n devices. It works with a wide range of signal
bandwidths including 20, 40, 80 and 80+80 160 MHz for both Tx and Rx for up to
4×4 MIMO configurations.

supporting the latest WLAN standard, 802.11ac, we are demonstrating the power
of NI’s software-defined, modular test systems. Our modular test platform
delivers faster test times and lower total cost of ownership, and by combining
it with LabVIEW, we help engineers address the latest emerging wireless
standards,” said James Truchard, president, CEO and cofounder of National Instruments.

NI is working
with several early access partners, including silicon suppliers, OEMs and
electronic manufacturing services (EMS) providers, to test the latest 802.11ac

NI will be
exhibiting the new 802.11ac test solution at Mobile World Congress in Barcelona,
Spain, from Feb. 27 through March 3.

802.11ac WLAN standard promises more than 3X faster transfer speeds, more
reliable coverage and up to 6X more power efficiency than equivalent 802.11n
solutions. These benefits have increased the demand on today’s wireless test
systems to provide better software flexibility, wider Tx and Rx bandwidth and
higher performance signal processing.

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