Tektronix will showcase its optical test solutions for datacenter networking at OFC 2017 on March 19-23 in Los Angeles.
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Tektronix said its solutions to improve electrical and optical performance will be demonstrated at OFC in booth 2339.
Tektronix testing solutions for datacenters
# DSA8300 sampling oscilloscope with an 80GHz optical sampling module showing support for IEEE 802.3bs based 400G optical testing for TDECQ, including advances in single-mode/multi-mode optical measurements for NRZ and PAM-4 up to 28GBd
# DPO70000SX 70GHz ATI performance oscilloscope analyzing single shot PAM-4 signals with live triggering and post-equalized error detection for 400G standards
# A demonstration of optical modulation analysis software supporting multi-OMA systems, featuring AWG70000 Series Arbitrary Waveform Generator, and DPO70000SX oscilloscope for applications such as spatial division multiplexing and more
# New announcements that will drive significant improvement in manufacturing yield on next generation optical components and interconnects
“With 100G moving into production and 400G design efforts in full swing, the test challenges around characterization, verification and debug of both silicon and system designs have never been greater,” said Brian Reich, general manager, Performance Oscilloscopes, Tektronix.
Meanwhile, Tektronix introduced equivalent time automated compliance test solutions for 4-lane 100G electrical interfaces defined in the IEEE 802.3bm and 802.3bj specifications. It’s available for Tektronix performance oscilloscopes including the DSA8300 >70 GHz bandwidth sequential equivalent-time sampling oscilloscope and the DPO70000SX real-time oscilloscope series with bandwidth up to 70 GHz.