National Instruments to showcase new PXI test solutions for mobile devices


By Telecom Lead Team: National Instruments announced that
it will showcase new PXI test solutions for mobile devices at Mobile World
Congress 2012 in Barcelona.


David Loadman, vice president of mobile device test at
National Instruments, and NI test product engineers, will demonstrate mobile
device validation and production test system for cellular and wireless
connectivity for LTE, WCDMA, GSM/EDGE, Bluetooth and WLAN.


Demonstration will also include test solution for
802.11ac chipsets and devices with both Rx and Tx configurations up to 4×4 MIMO
including support for 80 MHz and 80+80 MHz (160 MHz). Multi-DUT parallel
production test solution for mobile handsets demonstrating parallel testing of
HDMI video and GPS.


National Instruments claims that engineers can achieve
5-10X faster test times with NI software-defined PXI test solutions than with
traditional rack-and-stack box instruments. These systems are based on
multicore processors, field-programmable gate arrays (FPGAs) and high-speed
data buses, which provide field upgradability, faster processing, higher
bandwidth and scalable support for new cellular and wireless connectivity
standards.


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