NI announced a sub-6 GHz 5G test reference solution for meeting the demand for 5G New Radio (NR).
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At present, engineers are developing sub-6 GHz 5G RF components and devices. The cost effective sub-6 GHz 5G NR reference solution from NI helps engineers characterize their designs and transition from R&D to production test environments.
The new reference test solution from NI is suitable for testing wideband RFICs, especially those operating in the 3.3 – 4.2 GHz and 4.4 – 5.0 GHz bands.
Engineers can test devices operating with 400 MHz of continuous signal bandwidth and beyond with the PXIe-5840 Vector Signal Transceiver (VST), which includes 1 GHz of instantaneous signal generation and analysis bandwidth up to 6 GHz.
With the NI VST, the solution delivers residual EVM performance better than 0.32 percent (-50 dB) for 100 MHz NR signals along with faster measurement speed.
NI said the latest version of NI-RFmx NR measurement software offers 5G NR waveforms and measurement capability empowering engineers to test both OFDMA and DFT-s-OFDM carrier aggregated waveforms with flexible subcarrier spacing from 15 kHz to 120 kHz.
Jason White, director of RF and wireless test at NI, said: “By combining RF measurement capability with flexible measurement software, we are helping engineers reduce time-to-market and measurement correlation time.”
NI’s new technology for 5G test supplements a product portfolio for RF and semiconductor test, including measurement software for 2G, 3G, LTE-Advanced Pro, WiFi 802.11ax, Bluetooth 5 and more.
Engineers can use the NI VST alongside more than 600 modular PXI products, spanning DC to mmWave, to create comprehensive semiconductor characterization and manufacturing test systems.